Scanning Electron Microscopy
Currently, scanning electron microscopy is one of the methods used most often on a regular basis by researchers in natural sciences and materials. Its principle is based on the use of electrons as a source for observations, enabling us to observe specimens at up to a million times magnification (resolution less than 5nm) due to the oscillation properties of electrons.
The latest advances in this discipline permit the direct observation of biological materials without processing (fixation or dehydration). This represents a decrease in the structural alterations which are produced once specimens are collected. With scanning-mode observation of specimens and the use of transmitted electrons (STEM), specimens prepared on grids for transmission electron microscopy (TEM) can be observed.